15-19 April 2018
Paradise Point Resort & Spa
America/Los_Angeles timezone

12.26 An optical offset method for increased dynamic range in schlieren imaging systems

18 Apr 2018, 20:30
2h 1m
Paradise Point Resort & Spa

Paradise Point Resort & Spa

1404 Vacation Rd, San Diego, CA 92109

Speakers

Michael Jaworski (Princeton Plasma Physics Laboratory) Nirbhav Chopra (University of Illinois) Jacob Pearcy (Princeton University) David Ruzicc (University of Illinois) Ivan Shchelkanov (University of Illinois)

Description

High-temperature, atmospheric-pressure plasma systems operated in molecular gases present complex diagnostic challenges. Schlieren imaging is a technique that can be used to quantitatively measure the density of a gas stream through interpretation of directly-measured deflections from a collimated light source. The presence of hydrodynamic shocks presents a unique challenge to the accuracy of these measurements due to the wide dynamic range needed from the instrument. Schlieren imaging systems can achieve wide instrument ranges or high-accuracy measurements through adjustment of the aperture-cutoff, but achieving both simultaneously requires high-bit depth sensors. An alternative method is to make use of an optical offset system. A schlieren system has been designed with a large-area, rotatable wedge prism that produces an angle-dependent offset at the schlieren analyzer. With the use of a knife-edge analyzer, the system depends only on one component of the offset. In this manner, a high-accuracy measurement region can be “scanned” through a wider range, effectively increasing the dynamic range of the instrument without the use of a high-bit depth detector. Design and operation of the system using a 100mm, 900 arcsec. wedge prism is shown.

Primary author

Michael Jaworski (Princeton Plasma Physics Laboratory)

Co-authors

Nirbhav Chopra (University of Illinois) Jacob Pearcy (Princeton University) David Ruzicc (University of Illinois) Ivan Shchelkanov (University of Illinois)

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