15-19 April 2018
Paradise Point Resort & Spa
America/Los_Angeles timezone

6.48 Internal Magnetic Field Measurements of Translated and Merged Field-Reversed Configuration Plasmas in the FAT-CM Device

17 Apr 2018, 10:30
2h 1m
Paradise Point Resort & Spa

Paradise Point Resort & Spa

1404 Vacation Rd, San Diego, CA 92109

Speakers

Hiroshi Gota (TAE Technologies, Inc.) Junpei Ishiwata (Nihon University) Fumiyuki Tanaka (Nihon University) Akiyoshi Hosozawa (Nihon University) Tomohiko Asai (Nihon University) Tsutomu Takahashi (Nihon University) Junichi Sekiguchi (Nihon University) Thomas Roche (TAE Technologies, Inc.) Sean Dettrick (TAE Technologies, Inc.) Yung Mok (TAE Technologies, Inc.) Michl Binderbauer (TAE Technologies, Inc.) Toshiki Tajima (University of California, Irvine)

Description

Field-reversed configuration (FRC) Amplification via Translation – Collisional Merging (FAT-CM) experiments have recently commenced to study physics phenomena of collisions and merged FRC plasma states [1]. Two independently formed FRCs are translated into the confinement region of the FAT-CM device, collided near the midplane of the device with a relative speed of up to ~400 km/s, and a final merged FRC plasma state is achieved; this FRC collisional merging technique is essentially the same as in the C-2/C-2U experiments [2,3]. To measure magnetic field profiles of the translated and merged FRC plasmas, an internal magnetic probe array, developed/provided by TAE Technologies [3], has been installed in the midplane of the FAT-CM device. Initial magnetic field measurements indicate that both the translated and the merged FRC plasma states exhibit a clear field-reversal structure, which is qualitatively in good agreement with 2-D MHD simulations.
[1] F. Tanaka et al., in 26th Int’l Toki Conf., P2-17 (2017).
[2] M.W. Binderbauer et al., Phys. Rev. Lett. 105, 045003 (2010).
[3] H. Gota et al., Rev. Sci. Instrum. 83, 10D706 (2012).

Primary author

Hiroshi Gota (TAE Technologies, Inc.)

Co-authors

Junpei Ishiwata (Nihon University) Fumiyuki Tanaka (Nihon University) Akiyoshi Hosozawa (Nihon University) Tomohiko Asai (Nihon University) Tsutomu Takahashi (Nihon University) Junichi Sekiguchi (Nihon University) Thomas Roche (TAE Technologies, Inc.) Sean Dettrick (TAE Technologies, Inc.) Yung Mok (TAE Technologies, Inc.) Michl Binderbauer (TAE Technologies, Inc.) Toshiki Tajima (University of California, Irvine)

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