Novimir A. Pablant
(Princeton Plasma Physics Laboratory)
Andreas Langenberg
(Max-Planck-Institut fur Plasmaphysik)
Arturo Alonso
(Laboratorio Nacional de Fusion, CIEMAT)
Manfred Bitter
(Princeton Plasma Physics Laboratory)
Sergey Bozhenkov
(Max-Planck-Institut fur Plasmaphysik)
Rainer Burhenn
(Max-Planck-Institut fur Plasmaphysik)
Luis Delgado-Aparicio
(Princeton Plasma Physics Laboratory)
Golo Fuchert
(Max-Planck-Institut fur Plasmaphysik)
David Gates
(Princeton Plasma Physics Laboratory)
Ken W. Hill
(Princeton Plasma Physics Laboratory)
Udo Hoefel
(Max-Planck-Institut fur Plasmaphysik)
Matthias Hirsch
(Max-Planck-Institut fur Plasmaphysik)
James Kring
(Auburn University)
Oleksandr Marchuk
(Institut fur Energie und Klimaforschung, Plasmaphysik, Forschungszentrum Julich)
Michael Mardenfeld
(Princeton Plasma Physics Laboratory)
Ekkehard Pasch
(Max-Planck-Institut fur Plasmaphysik)
Andrea Pavone
(Max-Planck-Institut fur Plasmaphysik)
Matthew Reinke
(Oak Ridge National Laboratory)
Evan Scott
(Max-Planck-Institut fur Plasmaphysik)
Jakob Svennson
(Max-Planck-Institut fur Plasmaphysik)
Peter Traverso
(Auburn University)
Gavin Weir
(Max-Planck-Institut fur Plasmaphysik)
Thomas Wegner
(Max-Planck-Institut fur Plasmaphysik)
the W7-X Team
(Max-Planck-Institut fur Plasmaphysik)
A detailed description of the design and performance of the x-ray imaging crystal spectrometer systems (XICS, HR-XIS) installed on W7-X is presented, along with cross-validation of analysis methods and comparison with other diagnostic measurements. A detailed comparison of tomographically inverted electron temperature profiles from XICS is made with local measurements from Thomson scattering over a wide range of plasma parameters. These comparisons show good agreement within the range of electron temperatures that XICS is sensitive to, and highlight the use of XICS as a robust electron temperature profile diagnostic. Also presented is a comparison between measurements made using the four impurity spectra routinely recorded by the XICS system (Ar16+, Ar17+, Fe24+ and Mo32+). Finally a comparison of XICS analysis techniques between a Bayesian model using the Minerva framework, and a stepwise analysis based on fitting of line integrated spectra is shown.
Novimir A. Pablant
(Princeton Plasma Physics Laboratory)
Andreas Langenberg
(Max-Planck-Institut fur Plasmaphysik)
Arturo Alonso
(Laboratorio Nacional de Fusion, CIEMAT)
Manfred Bitter
(Princeton Plasma Physics Laboratory)
Sergey Bozhenkov
(Max-Planck-Institut fur Plasmaphysik)
Rainer Burhenn
(Max-Planck-Institut fur Plasmaphysik)
Luis Delgado-Aparicio
(Princeton Plasma Physics Laboratory)
Golo Fuchert
(Max-Planck-Institut fur Plasmaphysik)
David Gates
(Princeton Plasma Physics Laboratory)
Ken W. Hill
(Princeton Plasma Physics Laboratory)
Udo Hoefel
(Max-Planck-Institut fur Plasmaphysik)
Matthias Hirsch
(Max-Planck-Institut fur Plasmaphysik)
James Kring
(Auburn University)
Oleksandr Marchuk
(Institut fur Energie und Klimaforschung, Plasmaphysik, Forschungszentrum Julich)
Michael Mardenfeld
(Princeton Plasma Physics Laboratory)
Ekkehard Pasch
(Max-Planck-Institut fur Plasmaphysik)
Andrea Pavone
(Max-Planck-Institut fur Plasmaphysik)
Matthew Reinke
(Oak Ridge National Laboratory)
Evan Scott
(Max-Planck-Institut fur Plasmaphysik)
Jakob Svennson
(Max-Planck-Institut fur Plasmaphysik)
Peter Traverso
(Auburn University)
Gavin Weir
(Max-Planck-Institut fur Plasmaphysik)
Thomas Wegner
(Max-Planck-Institut fur Plasmaphysik)
the W7-X Team
(Max-Planck-Institut fur Plasmaphysik)
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