15-19 April 2018
Paradise Point Resort & Spa
America/Los_Angeles timezone

6.21 Development of a New Reflectometry Endstation for Crystal Calibrations using Synchrotron Light Sources

17 Apr 2018, 10:30
2h 1m
Paradise Point Resort & Spa

Paradise Point Resort & Spa

1404 Vacation Rd, San Diego, CA 92109

Speakers

Wayne Stolte (Nevada National Security Site) Ming Wu (Sandia National Laboratories) Franz Weber (Nevada National Security Site) Ken Moy (Nevada National Security Site) Chris Kruschwitz (Nevada National Security Site) Pat Lake (Sandia National Laboratories) Chris Bourdon (Sandia National Laboratories)

Description

A new reflectometry endstation has been developed specifically for the utilization of synchrotron radiation–based light sources. This paper describes the experimental setup and associated capabilities designed to measure crystal diffractive properties for a wide range of crystals, cut orientations, and surface geometries, including flat, convex, concave, and imaging arrangements. We are now adapting the system to render it suitable for use on the new NNSA soft x-ray calibration beam line (SXR) located at Stanford Synchrotron Radiation Light Source. This beam line (16-2) is expected to come online later in 2018. The endstation setup is unique in that it also accommodates large reflection angles (>80°). The system has been prototyped and successfully commissioned at Lawrence Berkeley National Laboratory’s Advanced Light Source beam line 9.3.1. Data from various calibration studies of flat quartz (100) and potassium acid phthalate (KAP), cylindrically bent KAP ranging in radius of curvature from 2 to 9 inches, spherically bent quartz (203), 220Ge and 335Ge, and tronconique-bent CsAP (cesium biphthalate) are discussed. This work was done by MSTS, LLC, Contractor for the NNSS, under Contract DE-NA-0003624 and by SNL under contract DE-NA-0003525. DOE/NV/0003624--0025.

Primary author

Wayne Stolte (Nevada National Security Site)

Co-authors

Ming Wu (Sandia National Laboratories) Franz Weber (Nevada National Security Site) Ken Moy (Nevada National Security Site) Chris Kruschwitz (Nevada National Security Site) Pat Lake (Sandia National Laboratories) Chris Bourdon (Sandia National Laboratories)

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