15-19 April 2018
Paradise Point Resort & Spa
America/Los_Angeles timezone

8.17 Measurement and modeling of bent and flat KAP (001) reflectivity

17 Apr 2018, 16:00
1d 2h
Paradise Point Resort & Spa

Paradise Point Resort & Spa

1404 Vacation Rd, San Diego, CA 92109

Speakers

Craig Kruschwitz (Nevada National Security Site, Los Alamos Operations) Ming Wu (Sandia National Laboratories) Wayne Stolte (Nevada National Security Site, Livermore Operations) Ken Moy (Nevada National Security Site, Special Technologies Laboratory) Guillaume Loisel (Sandia National Laboratories)

Description

Measurements were performed on bending magnet beam line 9.3.1 at the Advanced Light Source (Lawrence Berkeley National Laboratory, Berkeley, CA, USA) over the energy range of approximately 2.5 to 8 keV. A dual goniometer endstation was used to measure crystal diffraction properties for the potassium acid phthalate (KAP). The measurement results are subsequently compared to a crystal reflectivity model consisting of theoretical rocking curves calculated using XOP software (a multi-lamellar model for the bent crystals) coupled with a calculation of x-ray beam divergence based on the geometry of the measurement apparatus. We find generally good agreement between the measurements and the model. This work was done by National Security Technologies, LLC, under Contract No. DE-AC52-06NA25946, and by Mission Support and Test Services, LLC, under Contract No. DE-NA0003624, with the U.S. Department of Energy. DOE/NV/03624--0020.

Primary author

Craig Kruschwitz (Nevada National Security Site, Los Alamos Operations)

Co-authors

Ming Wu (Sandia National Laboratories) Wayne Stolte (Nevada National Security Site, Livermore Operations) Ken Moy (Nevada National Security Site, Special Technologies Laboratory) Guillaume Loisel (Sandia National Laboratories)

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