15-19 April 2018
Paradise Point Resort & Spa
America/Los_Angeles timezone

14.43 Zeff Measurements and Spectroscopic Impurity Survey on the C-2W Field-Reversed Configuration Plasma

19 Apr 2018, 10:30
2h 1m
Paradise Point Resort & Spa

Paradise Point Resort & Spa

1404 Vacation Rd, San Diego, CA 92109

Speakers

Marcel Nations (TAE Technologies, Inc.) Deepak Gupta (TAE Technologies, Inc.) Nathan Bolte (TAE Technologies, Inc.) Matthew C. Thompson (TAE Technologies, Inc.)

Description

In C-2W, an elevated impurity concentration, or the presence of high-Z impurities, can account for significant energy losses through radiation. To gauge plasma contamination from impurities, the effective ionic charge (Zeff) can be determined from measurements of Bremsstrahlung continuum radiation over a small spectral range free from line radiation. To this end, an integrated diagnostic system including visible and near-infrared Bremsstrahlung detectors, as well as Blamer-alpha (D) neutral detectors for pollutant removal, will be deployed in C-2W for improved estimates of time-dependent radial distributions of Zeff. The system is complemented by an array of survey spectrometers which enable full-range spectroscopic measurements of impurity emission lines from the vacuum ultraviolet to the near infrared, providing a good picture of the plasma composition. Here, the design scheme for this integrated diagnostic system is presented and discussed.

Primary author

Marcel Nations (TAE Technologies, Inc.)

Co-authors

Deepak Gupta (TAE Technologies, Inc.) Nathan Bolte (TAE Technologies, Inc.) Matthew C. Thompson (TAE Technologies, Inc.)

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